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Fully-Tunable Tunnel-Coupled Quantum Dots and Charge Sensing in a Commercial 22nm FD-SOI Process
Author(s) -
C. Power,
M. Moras,
A. Sokolov,
C. Rohrbacher,
X. Wu,
S.V. Amitonov,
I. Kriekouki,
A. Apra,
P. Giounanlis,
M. Asker,
M. Harkin,
P. Hanos-Puskai,
P. Bisiaux,
I. Bashir,
D. Redmond,
D. Leipold,
R.B. Staszewski,
B. Barry,
N. Samkharadze,
E. Blokhina
Publication year - 2025
Publication title -
ieee electron device letters
Language(s) - English
Resource type - Magazines
SCImago Journal Rank - 1.337
H-Index - 154
eISSN - 1558-0563
pISSN - 0741-3106
DOI - 10.1109/led.2025.3595384
Subject(s) - engineered materials, dielectrics and plasmas , components, circuits, devices and systems
Confining electrons or holes in quantum dots formed in the channel of industry-standard fully depleted silicon-on-insulator CMOS structures is a promising approach to scalable qubit architectures. In this communication, we present measurement results of a commercial nanostructure fabricated using the GlobalFoundries 22FDX TM industrial process. These quantum dots are formed in the device channel between polysilicon gates. We report precise control over inter-dot coupling, bias triangle formation, and single electron box sensing in a commercial process for the first time.

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