ENZ-Based High Fidelity Complex-Field Reconstruction
Author(s) -
Wencan Wei,
Fuda Jiang,
Chonglei Zhang
Publication year - 2025
Publication title -
ieee photonics journal
Language(s) - English
Resource type - Magazines
SCImago Journal Rank - 0.725
H-Index - 73
eISSN - 1943-0655
DOI - 10.1109/jphot.2025.3613743
Subject(s) - engineered materials, dielectrics and plasmas , photonics and electrooptics
The Extended Nijboer-Zernike (ENZ) theory, an analytical solution based on Zernike polynomials within Fourier integration, offers unique advantages in characterizing imaging spaces. In contrast to conventional phase retrieval algorithms that typically require weak amplitude variation, the ENZ model is well-suited to handle significant amplitude variations in complex field reconstruction. This paper introduces a complex-field retrieval method for microscopic imaging systems based on the ENZ model. The proposed method is particularly effective in scenarios involving substantial amplitude modulation, exhibiting high convergence accuracy and robustness. The performance of the reconstruction is demonstrated through extensive numerical simulations and experimental validation under varying parameter conditions
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