z-logo
open-access-imgOpen Access
IoT-Driven Regression Tree Models for Efficient Microwave Dielectric Material Characterization: Addressing Non-Linear Cavity Sensing
Author(s) -
Ahmad Khusro,
Zubair Akhter,
Abhishek K. Jha,
Atif Shamim,
Mohammad S. Hashmi
Publication year - 2025
Publication title -
ieee internet of things journal
Language(s) - English
Resource type - Magazines
SCImago Journal Rank - 2.075
H-Index - 97
eISSN - 2327-4662
DOI - 10.1109/jiot.2025.3575287
Subject(s) - computing and processing , communication, networking and broadcast technologies
Interconnected microwave dielectric sensing nodes have the potential to revolutionize microwave material processing and design, where microwave dielectric materials characterization (MDMC) with high precision and rapid circuit design are crucial. This research presents an Internet of Things (IoT)-enabled automated MDMC system designed to tackle the non-linearity challenges in the extended cavity perturbation regime. Utilizing a cylindrical cavity operating in TE111 mode at 5 GHz, the proposed MDMC system is extensively trained on a diverse range of materials through numerous full-wave 3D electromagnetic simulations. The outputs, i.e., relative permittivity and loss tangent, are derived using advanced machine learning models, including Decision Tree (DT) and Ensemble Learning (EL). A comparative analysis that incorporates simulation, measurement, and predicted permittivity values across varying sample dimensions demonstrates the robustness and accuracy of the DT and EL model. This validates the effectiveness of our high-quality sensor node and sophisticated data processing techniques within an IoT-centric framework.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Empowering knowledge with every search

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom