Open AccessScattering Parameter Characterization of a Novel Four-Port Fixture Using Time Domain Gating and Mason’s Gain Formula
Author(s) -
Jim-Wei Wu,
Bo-Jun Chen,
Jia-Cheng Li
Publication year - 2025
Publication title -
ieee access
Language(s) - English
Resource type - Magazines
SCImago Journal Rank - 0.587
H-Index - 127
eISSN - 2169-3536
DOI - 10.1109/access.2025.3590875
Subject(s) - aerospace , bioengineering , communication, networking and broadcast technologies , components, circuits, devices and systems , computing and processing , engineered materials, dielectrics and plasmas , engineering profession , fields, waves and electromagnetics , general topics for engineers , geoscience , nuclear engineering , photonics and electrooptics , power, energy and industry applications , robotics and control systems , signal processing and analysis , transportation
Modern electronic devices comprise a complex structure of interconnected components, and signals passing through various fixtures are prone to attenuation and distortion across various frequencies. This paper presents a novel four-port fixture characterization scheme that converts the S-parameters of a 2x-Thru structure into time-domain reflectometry data. This data is then separated into the two sides of the fixture via time-domain gating. After the remaining S-parameters are calculated using Mason’s gain formula, fixture effects are removed through a de-embedding process involving matrix operations to yield the S-parameters of the device under test. The efficacy of the proposed scheme is demonstrated through comparison with the industry-standard automatic fixture removal (AFR) algorithm.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom