Compact Dual-Polarized Quad-Ridged Probe Antenna for Spherical Near-Field Measurement Systems in 6G Bands

This paper presents the design, fabrication, and evaluation of a compact dual-polarized quad-ridged probe tailored for spherical near-field measurement systems operating in 6G frequency bands. The proposed probe demonstrates stable performance across the 4–16 GHz frequency range. The dual-polarized quad-ridged structure ensures high measurement accuracy for both horizontal and vertical polarizations, with a measured impedance bandwidth (VSWR ≤ 3:1) covering the 4.4–4.8 GHz, 7.125–8.5 GHz, and 14.8–15.35 GHz candidate bands. The probe achieves peak gains of up to 12 dBi at 15 GHz. A detailed description of the design process is provided, including electromagnetic simulations and material selection. Experimental validation confirms the probe’s performance in terms of bandwidth and measurement precision. The proposed probe contributes to the advancement of next-generation near-field measurement systems, facilitating precise and efficient testing of high-frequency antennas for 6G technologies.