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The complex analysis of X‐ray mesh scans for macromolecular crystallography
Author(s) -
Melnikov Igor,
Svensson Olof,
Bourenkov Gleb,
Leonard Gordon,
Popov Alexander
Publication year - 2018
Publication title -
acta crystallographica section d
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 7.374
H-Index - 138
ISSN - 2059-7983
DOI - 10.1107/s2059798318002735
Subject(s) - diffraction , superposition principle , crystal (programming language) , x ray crystallography , materials science , raster scan , sample (material) , crystallography , raster graphics , centring , diffraction topography , optics , physics , computer science , computer graphics (images) , chemistry , engineering , mechanical engineering , quantum mechanics , thermodynamics , programming language
In macromolecular crystallography, mesh (raster) scans are carried out either as part of X‐ray‐based crystal‐centring routines or to identify positions on the sample holder from which diffraction images can be collected. Here, the methods used in MeshBest , software which automatically analyses diffraction images collected during a mesh scan and produces a two‐dimensional crystal map showing estimates of the dimensions, centre positions and diffraction qualities of each crystal contained in the mesh area, are presented. Sample regions producing diffraction images resulting from the superposition of more than one crystal are also distinguished from regions with single‐crystal diffraction. The applicability of the method is demonstrated using several cases.