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Experimentally obtained and computer‐simulated X‐ray non‐coplanar 18‐beam pinhole topographs for a silicon crystal
Author(s) -
Okitsu Kouhei,
Imai Yasuhiko,
Yoda Yoshitaka
Publication year - 2019
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273319002936
Subject(s) - pinhole (optics) , crystal (programming language) , fast fourier transform , optics , beam (structure) , synchrotron , x ray , silicon , diffraction , physics , fourier transform , materials science , amplitude , phase problem , optoelectronics , computer science , quantum mechanics , algorithm , programming language
Non‐coplanar 18‐beam X‐ray pinhole topographs for a silicon crystal were computer simulated by fast Fourier transforming the X‐ray rocking amplitudes that were obtained by solving the n ‐beam ( n = 18) Ewald–Laue dynamical theory (E‐L&FFT method). They were in good agreement with the experimentally obtained images captured using synchrotron X‐rays. From this result and further consideration based on it, it has been clarified that the X‐ray diffraction intensities when n X‐ray waves are simultaneously strong in the crystal can be computed for any n by using the E‐L&FFT method.