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Experimentally obtained and computer‐simulated X‐ray asymmetric eight‐beam pinhole topographs for a silicon crystal
Author(s) -
Okitsu Kouhei,
Imai Yasuhiko,
Yoda Yoshitaka,
Ueji Yoshinori
Publication year - 2019
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273319001499
Subject(s) - pinhole (optics) , beam (structure) , optics , synchrotron , crystal (programming language) , silicon , x ray , eigenvalues and eigenvectors , fourier transform , physics , materials science , computational physics , optoelectronics , quantum mechanics , computer science , programming language
In this study, experimentally obtained eight‐beam pinhole topographs for a silicon crystal using synchrotron X‐rays were compared with computer‐simulated images, and were found to be in good agreement. The experiment was performed with an asymmetric all‐Laue geometry. However, the X‐rays exited from both the bottom and side surfaces of the crystal. The simulations were performed using two different approaches: one was the integration of the n ‐beam Takagi–Taupin equation, and the second was the fast Fourier transformation of the X‐ray amplitudes obtained by solving the eigenvalue problem of the n ‐beam Ewald–Laue theory as reported by Kohn & Khikhlukha [ Acta Cryst . (2016), A 72 , 349–356] and Kohn [ Acta Cryst. (2017), A 73 , 30–38].