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Coherent diffraction imaging: consistency of the assembled three‐dimensional distribution
Author(s) -
Tegze Miklós,
Bortel Gábor
Publication year - 2016
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273316008366
Subject(s) - diffraction , coherent diffraction imaging , reciprocal lattice , electron diffraction , electron backscatter diffraction , consistency (knowledge bases) , distribution (mathematics) , particle (ecology) , materials science , optics , x ray crystallography , physics , computational physics , molecular physics , crystallography , chemistry , mathematics , phase retrieval , quantum mechanics , geometry , mathematical analysis , oceanography , fourier transform , geology
The short pulses of X‐ray free‐electron lasers can produce diffraction patterns with structural information before radiation damage destroys the particle. From the recorded diffraction patterns the structure of particles or molecules can be determined on the nano‐ or even atomic scale. In a coherent diffraction imaging experiment thousands of diffraction patterns of identical particles are recorded and assembled into a three‐dimensional distribution which is subsequently used to solve the structure of the particle. It is essential to know, but not always obvious, that the assembled three‐dimensional reciprocal‐space intensity distribution is really consistent with the measured diffraction patterns. This paper shows that, with the use of correlation maps and a single parameter calculated from them, the consistency of the three‐dimensional distribution can be reliably validated.