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Diffuse multiple scattering
Author(s) -
Nisbet A. G. A.,
Beutier G.,
Fabrizi F.,
Moser B.,
Collins S. P.
Publication year - 2015
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273314026515
Subject(s) - diffraction , line (geometry) , lattice (music) , scattering , materials science , x ray crystallography , kikuchi line , crystallography , optics , computational physics , physics , chemistry , geometry , electron diffraction , mathematics , reflection high energy electron diffraction , acoustics
A new form of diffraction lines has been identified, similar to Rutherford, Kikuchi and Kossel lines. This paper highlights some of the properties of these lines and shows how they can be used to eliminate the need for sample/source matching in Lonsdale's triple convergent line method in lattice‐parameter determination.