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New capabilities for `colouring in' the chemistry of crystal defects atom‐by‐atom
Author(s) -
Haigh Sarah J.
Publication year - 2014
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273314023055
Subject(s) - atom (system on chip) , dislocation , materials science , scanning transmission electron microscopy , crystallography , high resolution transmission electron microscopy , resolution (logic) , cadmium telluride photovoltaics , transmission electron microscopy , crystal (programming language) , nanotechnology , chemistry , computer science , embedded system , artificial intelligence , programming language
The latest generation of scanning transmission electron microscopes equipped with high‐efficiency energy‐dispersive X‐ray detectors are breaking new ground with respect to high‐resolution elemental imaging of materials. In this issue, Paulauskas et al. [ Acta Cryst. (2014), A70, 524531 ] demonstrate impressive results when applying this technique to improve understanding of CdTe dislocation structures.