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An alternative method for data analysis in serial femtosecond crystallography
Author(s) -
Zhang Tao,
Li Yang,
Wu Lijie
Publication year - 2014
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273314016982
Subject(s) - femtosecond , extrapolation , reciprocal lattice , diffraction , basis (linear algebra) , crystallography , resolution (logic) , laser , electron diffraction , reciprocal , materials science , x ray crystallography , computational physics , computer science , optics , physics , chemistry , mathematics , statistics , geometry , artificial intelligence , linguistics , philosophy
Serial femtosecond crystallography (SFX) [Chapman et al. (2011), Nature , 470 , 73–77], based on the X‐ray free‐electron laser, is a new and powerful tool for structure analysis at atomic resolution. This study proposes an extrapolation method for diffraction data analysis on the basis of diffraction intensity distribution in reciprocal space. Results show that this new method can restore SFX simulation data to structure factors that are more consistent with the structures used in simulation.