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Accurate atomic displacement parameters from time‐of‐flight neutron‐diffraction data at TOPAZ
Author(s) -
Jørgensen Mads R. V.,
Hathwar Venkatesha R.,
Sist Mattia,
Wang Xiaoping,
Hoffmann Christina M.,
Briseno Alejandro L.,
Overgaard Jacob,
Iversen Bo B.
Publication year - 2014
Publication title -
acta crystallographica section a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.742
H-Index - 83
ISSN - 2053-2733
DOI - 10.1107/s2053273314015599
Subject(s) - topaz , diffractometer , neutron diffraction , time of flight , diffraction , displacement (psychology) , materials science , neutron , physics , optics , nuclear physics , geology , mineralogy , scanning electron microscope , psychology , psychotherapist
Accurate atomic displacement parameters (ADPs) are a good indication of high‐quality diffraction data. Results from the newly commissioned time‐of‐flight Laue diffractometer TOPAZ at the SNS are presented. Excellent agreement is found between ADPs derived independently from the neutron and X‐ray data emphasizing the high quality of the data from the time‐of‐flight Laue diffractometer.