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Methods for orientation and phase identification of nano‐sized embedded secondary phase particles by 4D scanning precession electron diffraction
Author(s) -
Rauch E. F.,
Véron M.
Publication year - 2019
Publication title -
acta crystallographica section b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.604
H-Index - 33
ISSN - 2052-5206
DOI - 10.1107/s2052520619007583
Subject(s) - diffraction , phase (matter) , electron diffraction , orientation (vector space) , materials science , scanning electron microscope , transmission electron microscopy , precession , matrix (chemical analysis) , scanning transmission electron microscopy , electron backscatter diffraction , optics , nanotechnology , physics , condensed matter physics , mathematics , composite material , geometry , quantum mechanics
The diffraction patterns acquired with transmission electron microscopes gather reflections from all crystallites that overlap in the foil thickness. The superimposition renders automated orientation or phase mapping difficult, in particular when secondary phase particles are embedded in a dominant diffracting matrix. Several numerical approaches specifically developed to overcome this issue for 4D scanning precession electron diffraction data sets are described. They consist either in emphasizing the signature of the particles or in subtracting the matrix information out of the collected set of patterns. The different strategies are applied successively to a steel sample containing precipitates that are in Burgers orientation relationship with the matrix and to an aluminium alloy with randomly oriented Mn‐rich particles.