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Closing the gap between electron and X‐ray crystallography
Author(s) -
Mugnaioli Enrico
Publication year - 2015
Publication title -
acta crystallographica section b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.604
H-Index - 33
ISSN - 2052-5206
DOI - 10.1107/s2052520615022441
Subject(s) - closing (real estate) , electron , characterization (materials science) , diffraction , x ray , scattering , crystallography , x ray crystallography , electron diffraction , electron crystallography , physics , materials science , algorithm , computer science , optics , chemistry , nuclear physics , political science , law
The development of a proper refinement algorithm that takes into account dynamical scattering guarantees, for electron crystallography, results approaching X‐rays in terms of precision, accuracy and reliability. The combination of such dynamical refinement and electron diffraction tomography establishes a complete pathway for the structure characterization of single sub‐micrometric crystals.