Premium
X‐ray resonant single‐crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu 2 ZnSnS 4 compound
Author(s) -
Lafond Alain,
Choubrac Léo,
GuillotDeudon Catherine,
Fertey Pierre,
Evain Michel,
Jobic Stéphane
Publication year - 2014
Publication title -
acta crystallographica section b
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.604
H-Index - 33
ISSN - 2052-5206
DOI - 10.1107/s2052520614003138
Subject(s) - kesterite , diffraction , czts , materials science , crystallography , photovoltaic system , x ray crystallography , single crystal , crystal structure , crystal (programming language) , optics , thin film , nanotechnology , chemistry , physics , computer science , ecology , programming language , biology
Cu/Zn disorder in the kesterite Cu 2 ZnSnS 4 derivatives used for thin film based solar cells is an important issue for photovoltaic performances. Unfortunately, Cu and Zn cannot be distinguished by conventional laboratory X‐ray diffraction. This paper reports on a resonant diffraction investigation of a Cu 2 ZnSnS 4 single crystal from a quenched powdered sample. The full disorder of Cu and Zn in the z = 1/4 atomic plane is shown. The structure, namely disordered kesterite, is then described in the space group.