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X‐ray Laue diffraction by sectioned multilayers. I.  Pendellösung effect and rocking curves
Author(s) -
Punegov Vasily I.
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521006408
Subject(s) - diffraction , wedge (geometry) , synchrotron radiation , optics , x ray crystallography , physics , materials science , x ray , synchrotron , interference (communication) , condensed matter physics , channel (broadcasting) , electrical engineering , engineering
Using the Takagi–Taupin equations, X‐ray Laue dynamical diffraction in flat and wedge multilayers is theoretically considered. Recurrence relations are obtained that describe Laue diffraction in structures that are inhomogeneous in depth. The influence of sectioned depth, imperfections and non‐uniform distribution of the multilayer period on the Pendellösung effect and rocking curves is studied. Numerical simulation of Laue diffraction in multilayer structures W/Si and Mo/Si is carried out. It is shown that the determination of sectioned depths based on the period of the interference fringes of the experimental rocking curves of synchrotron radiation is not always correct.

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