Open AccessOff‐axis multilayer zone plate with 16 nm × 28 nm focus for high‐resolution X‐ray beam induced current imaging
Author(s) -
Soltau Jakob,
Chayanun Lert,
Lyubomirskiy Mikhail,
Wallentin Jesper,
Osterhoff Markus
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521006159
Subject(s) - optics , focus (optics) , zone plate , materials science , aperture (computer memory) , focal length , beam (structure) , sorting , current (fluid) , x ray , image resolution , diffraction , optoelectronics , physics , computer science , lens (geology) , programming language , acoustics , thermodynamics
Using multilayer zone plates (MZPs) as two‐dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order‐sorting apertures prohibits practical working distances. To overcome this issue, here an off‐axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order‐sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real‐space 2D mapping of local electric fields and charge carrier recombination using X‐ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off‐axis MZP can reach sub‐10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices.