Open AccessIRIXS Spectrograph: an ultra high‐resolution spectrometer for tender RIXS
Author(s) -
Bertinshaw Joel,
Mayer Simon,
Dill Frank-Uwe,
Suzuki Hakuto,
Leupold Olaf,
Jafari Atefeh,
Sergueev Ilya,
Spiwek Manfred,
Said Ayman,
Kasman Elina,
Huang Xianrong,
Keimer Bernhard,
Gretarsson Hlynur
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521003805
Subject(s) - monochromator , spectrograph , spectrometer , optics , spectral resolution , physics , resolution (logic) , collimated light , synchrotron , scattering , spectral line , wavelength , laser , astronomy , artificial intelligence , computer science
The IRIXS Spectrograph represents a new design of an ultra‐high‐resolution resonant inelastic X‐ray scattering (RIXS) spectrometer that operates at the Ru L 3 ‐edge (2840 eV). First proposed in the field of hard X‐rays by Shvyd'ko [(2015), Phys. Rev. A , 91 , 053817], the X‐ray spectrograph uses a combination of laterally graded multilayer mirrors and collimating/dispersing Ge(111) crystals optics in a novel spectral imaging approach to overcome the energy resolution limitation of a traditional Rowland‐type spectrometer [Gretarsson et al. (2020), J. Synchrotron Rad. 27 , 538–544]. In combination with a dispersionless nested four‐bounce high‐resolution monochromator design that utilizes Si(111) and Al 2 O 3 (110) crystals, an overall energy resolution better than 35 meV full width at half‐maximum has been achieved at the Ru L 3 ‐edge, in excellent agreement with ray‐tracing simulations.