z-logo
open-access-imgOpen Access
The fast multi‐frame X‐ray diffraction detector at the Dynamic Compression Sector
Author(s) -
Sinclair N. W.,
Turneaure S. J.,
Wang Y.,
Zimmerman K.,
Gupta Y. M.
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521003775
Subject(s) - detector , diffraction , dynamic range , optics , advanced photon source , frame (networking) , dynamic range compression , wide dynamic range , split hopkinson pressure bar , temporal resolution , frame rate , explosive material , physics , synchronization (alternating current) , materials science , image resolution , bar (unit) , high dynamic range , computer science , storage ring , acoustics , particle accelerator , composite material , telecommunications , chemistry , beam (structure) , channel (broadcasting) , organic chemistry , strain rate , meteorology
A multi‐frame, X‐ray diffraction (XRD) detector system has been developed for use in time‐resolved XRD measurements during single‐event experiments at the Dynamic Compression Sector (DCS) at the Advanced Photon Source (APS). The system is capable of collecting four sequential XRD patterns separated by 153 ns, the period of the APS storage ring in the 24‐bunch mode. This capability allows an examination of the temporal evolution of material dynamics in single‐event experiments, such as plate impact experiments, explosive detonations, and split‐Hopkinson pressure bar experiments. This system is available for all user experiments at the DCS. Here, the system description and measured performance parameters (detective quantum efficiency, spatial and temporal resolution, and dynamic range) are presented along with procedures for synchronization and image post‐processing.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here