Open AccessA UHV MOKE magnetometer complementing XMCD‐PEEM at the Elettra Synchrotron
Author(s) -
Genuzio Francesca,
Giela Tomasz,
Lucian Matteo,
Menteş Tevfik Onur,
Brondin Carlo Alberto,
Cautero Giuseppe,
Mazalski Piotr,
Bonetti Stefano,
Korecki Jozef,
Locatelli Andrea
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521002885
Subject(s) - magnetometer , beamline , synchrotron , magnetic circular dichroism , optics , materials science , photoemission electron microscopy , kerr effect , magneto optic kerr effect , synchrotron light source , physics , beam (structure) , magnetic field , electron microscope , storage ring , quantum mechanics , astronomy , nonlinear system , spectral line
We report on a custom‐built UHV‐compatible Magneto‐Optical Kerr Effect (MOKE) magnetometer for applications in surface and materials sciences, operating in tandem with the PhotoEmission Electron Microscope (PEEM) endstation at the Nanospectroscopy beamline of the Elettra synchrotron. The magnetometer features a liquid‐nitrogen‐cooled electromagnet that is fully compatible with UHV operation and produces magnetic fields up to about 140 mT at the sample. Longitudinal and polar MOKE measurement geometries are realized. The magneto‐optical detection is based on polarization analysis using a photoelastic modulator. The sample manipulation system is fully compatible with that of the PEEM, making it possible to exchange samples with the beamline endstation, where complementary X‐ray imaging and spectroscopy techniques are available. The magnetometer performance is illustrated by experiments on cobalt ultra‐thin films, demonstrating close to monolayer sensitivity. The advantages of combining in situ growth, X‐ray Magnetic Circular Dichroism imaging (XMCD‐PEEM) and MOKE magnetometry into a versatile multitechnique facility are highlighted.