Open AccessNovel experimental setup for megahertz X‐ray diffraction in a diamond anvil cell at the High Energy Density (HED) instrument of the European X‐ray Free‐Electron Laser (EuXFEL)
Author(s) -
Liermann H. P.,
Konôpková Z.,
Appel K.,
Prescher C.,
Schropp A.,
Cerantola V.,
Husband R. J.,
McHardy J. D.,
McMahon M. I.,
McWilliams R. S.,
Pépin C. M.,
Mainberger J.,
Roeper M.,
Berghäuser A.,
Damker H.,
Talkovski P.,
Foese M.,
Kujala N.,
Ball O. B.,
Baron M. A.,
Briggs R.,
Bykov M.,
Bykova E.,
Chantel J.,
Coleman A. L.,
Cynn H.,
Dattelbaum D.,
Dresselhaus-Marais L. E.,
Eggert J. H.,
Ehm L.,
Evans W. J.,
Fiquet G.,
Frost M.,
Glazyrin K.,
Goncharov A. F.,
Hwang H.,
Jenei Zs.,
Kim J.-Y.,
Langenhorst F.,
Lee Y.,
Makita M.,
Marquardt H.,
McBride E. E.,
Merkel S.,
Morard G.,
O'Ban E. F.,
Otzen C.,
Pace E. J.,
Pelka A.,
Pigott J. S.,
Prakapenka V. B.,
Redmer R.,
Sanchez-Valle C.,
Schoelmerich M.,
Speziale S.,
Spiekermann G.,
Sturtevant B. T.,
Toleikis S.,
Velisavljevic N.,
Wilke M.,
Yoo C.-S.,
Baehtz C.,
Zastrau U.,
Strohm C.
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577521002551
Subject(s) - diffraction , beamline , optics , diamond anvil cell , laser , free electron laser , diamond , vacuum chamber , x ray , materials science , detector , synchrotron , physics , beam (structure) , composite material
The high‐precision X‐ray diffraction setup for work with diamond anvil cells (DACs) in interaction chamber 2 (IC2) of the High Energy Density instrument of the European X‐ray Free‐Electron Laser is described. This includes beamline optics, sample positioning and detector systems located in the multipurpose vacuum chamber. Concepts for pump–probe X‐ray diffraction experiments in the DAC are described and their implementation demonstrated during the First User Community Assisted Commissioning experiment. X‐ray heating and diffraction of Bi under pressure, obtained using 20 fs X‐ray pulses at 17.8 keV and 2.2 MHz repetition, is illustrated through splitting of diffraction peaks, and interpreted employing finite element modeling of the sample chamber in the DAC.