
Wave propagation and focusing of soft X‐rays by spherical bent microchannel plates
Author(s) -
Mazuritskiy M. I.,
Lerer A. M.,
Marcelli A.,
Dabagov S. B.,
Coreno M.,
D'Elia A.,
Rezvani S. J.
Publication year - 2021
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577520016458
Subject(s) - bent molecular geometry , synchrotron radiation , physics , radiation , optics , curvature , microchannel , microchannel plate detector , detector , materials science , geometry , mechanics , mathematics , composite material
Synchrotron radiation sources have been used to study the focusing properties and angular distribution of X‐ray radiation at the exit of spherically bent microchannel plates (MCPs). In this contribution it is shown how soft X‐ray radiation at energies up to 1.5 keV can be focused by spherically bent MCPs with curvature radii R of 30 mm and 50 mm. For these devices, a focus spot is detectable at a distance between the detector and the MCP of less than R /2, with a maximum focusing efficiency up to 23% of the flux illuminating the MCP. The soft X‐ray radiation collected at the exit of microchannels of spherically bent MCPs are analyzed in the framework of a wave approximation. A theoretical model for the wave propagation of radiation through MCPs has been successfully introduced to explain the experimental results. Experimental data and simulations of propagating radiation represent a clear confirmation of the wave channeling phenomenon for the radiation in spherically bent MCPs.