Open AccessFull strain tensor measurements with X‐ray diffraction and strain field mapping: a simulation study
Author(s) -
Tang M. X.,
Huang J. W.,
E J. C.,
Zhang Y. Y.,
Luo S. N.
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577520003926
Subject(s) - infinitesimal strain theory , diffraction , materials science , digital image correlation , strain (injury) , synchrotron radiation , synchrotron , cauchy stress tensor , plane stress , x ray crystallography , optics , crystallography , physics , composite material , chemistry , finite element method , classical mechanics , thermodynamics , medicine
Strain tensor measurements are important for understanding elastic and plastic deformation, but full bulk strain tensor measurement techniques are still lacking, in particular for dynamic loading. Here, such a methodology is reported, combining imaging‐based strain field mapping and simultaneous X‐ray diffraction for four typical loading modes: one‐dimensional strain/stress compression/tension. Strain field mapping resolves two in‐plane principal strains, and X‐ray diffraction analysis yields volumetric strain, and thus the out‐of‐plane principal strain. This methodology is validated against direct molecular dynamics simulations on nanocrystalline tantalum. This methodology can be implemented with simultaneous X‐ray diffraction and digital image correlation in synchrotron radiation or free‐electron laser experiments.