Open AccessXTIP – the world's first beamline dedicated to the synchrotron X‐ray scanning tunneling microscopy technique
Author(s) -
Rose Volker,
Shirato Nozomi,
Bartlein Michael,
Deriy Alex,
Ajayi Tolulope,
Rosenmann Daniel,
Hla Saw-Wai,
Fisher Mike,
Reininger Ruben
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577520003689
Subject(s) - beamline , advanced photon source , synchrotron , optics , synchrotron radiation , monochromatic color , scanning tunneling microscope , physics , materials science , nanotechnology , beam (structure)
In recent years, there have been numerous efforts worldwide to develop the synchrotron X‐ray scanning tunneling microscopy (SX‐STM) technique. Here, the inauguration of XTIP, the world's first beamline fully dedicated to SX‐STM, is reported. The XTIP beamline is located at Sector 4 of the Advanced Photon Source at Argonne National Laboratory. It features an insertion device that can provide left‐ or right‐circular as well as horizontal‐ and vertical‐linear polarization. XTIP delivers monochromatic soft X‐rays of between 400 and 1900 eV focused into an environmental enclosure that houses the endstation instrument. This article discusses the beamline system design and its performance.