Open AccessNanoscale determination of interatomic distance by ptychography‐EXAFS method using advanced Kirkpatrick–Baez mirror focusing optics
Author(s) -
Hirose Makoto,
Shimomura Kei,
Higashino Takaya,
Ishiguro Nozomu,
Takahashi Yukio
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519017004
Subject(s) - extended x ray absorption fine structure , optics , ptychography , materials science , absorption (acoustics) , nanoscopic scale , surface extended x ray absorption fine structure , diffraction , resolution (logic) , absorption spectroscopy , physics , nanotechnology , artificial intelligence , computer science
This work demonstrates a combination technique of X‐ray ptychography and the extended X‐ray absorption fine structure (ptychography‐EXAFS) method, which can determine the interatomic distances of bulk materials at the nanoscale. In the high‐resolution ptychography‐EXAFS method, it is necessary to use high‐intense coherent X‐rays with a uniform wavefront in a wide energy range, hence a ptychographic measurement system installed with advanced Kirkpatrick–Baez mirror focusing optics is developed and its performance is evaluated. Ptychographic diffraction patterns of micrometre‐size MnO particles are collected by using this system at 139 energies between 6.504 keV and 7.114 keV including the Mn K absorption edge, and then the EXAFS of MnO is derived from the reconstructed images. By analyzing the EXAFS spectra obtained from a 48 nm × 48 nm region, the nanoscale bond lengths of the first and second coordination shells of MnO are determined. The present approach has great potential to elucidate the unclarified relationship among the morphology, electronic state and atomic arrangement of inhomogeneous bulk materials with high spatial resolution.