Open AccessFast diffraction‐enhanced imaging using continuous sample rotation and analyzer crystal scanning
Author(s) -
Yoneyama Akio,
Lwin Thet Thet,
Kawamoto Masahide
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519016795
Subject(s) - spectrum analyzer , diffraction , materials science , sample (material) , optics , rotation (mathematics) , dynamic range , crystal (programming language) , analytical chemistry (journal) , chemistry , computer science , physics , chromatography , artificial intelligence , programming language
Diffraction‐enhanced imaging (DEI) has high sensitivity and a wide dynamic range of density and thus can be used for fine imaging of biological and organic samples that include large differences in density. A fast DEI method composed of continuous fast sample rotations and slow analyzer crystal scanning was developed to shorten the measurement period. Fine sectional images of a biological sample were successfully obtained within a half measurement period of the conventional step‐scanning method while keeping the same exposure time. In addition, a fine three‐dimensional image of a rat tail was obtained with a 375 s measurement period.