
X‐ray fluorescence detection for serial macromolecular crystallography using a JUNGFRAU pixel detector
Author(s) -
Martiel Isabelle,
Mozzanica Aldo,
Opara Nadia L.,
Panepucci Ezequiel,
Leonarski Filip,
Redford Sophie,
Mohacsi Istvan,
Guzenko Vitaliy,
Ozerov Dmitry,
Padeste Celestino,
Schmitt Bernd,
Pedrini Bill,
Wang Meitian
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519016758
Subject(s) - beamline , synchrotron , detector , optics , x ray detector , fiducial marker , fluorescence , x ray , physics , materials science , beam (structure) , computer science , artificial intelligence
Detection of heavy elements, such as metals, in macromolecular crystallography (MX) samples by X‐ray fluorescence is a function traditionally covered at synchrotron MX beamlines by silicon drift detectors, which cannot be used at X‐ray free‐electron lasers because of the very short duration of the X‐ray pulses. Here it is shown that the hybrid pixel charge‐integrating detector JUNGFRAU can fulfill this function when operating in a low‐flux regime. The feasibility of precise position determination of micrometre‐sized metal marks is also demonstrated, to be used as fiducials for offline prelocation in serial crystallography experiments, based on the specific fluorescence signal measured with JUNGFRAU, both at the synchrotron and at SwissFEL. Finally, the measurement of elemental absorption edges at a synchrotron beamline using JUNGFRAU is also demonstrated.