Open AccessWhite beam diagnostics using X‐ray back‐scattering from a CVD diamond vacuum window
Author(s) -
van Silfhout Roelof,
Pothin Daniel,
Martin Thierry
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519015340
Subject(s) - undulator , optics , beamline , beam (structure) , synchrotron radiation , physics , beam diameter , pinhole (optics) , pinhole camera , laser beam quality , synchrotron , materials science , laser , laser beams
Collecting back‐scattered X‐rays from vacuum windows using a pinhole X‐ray camera provides an efficient and reliable method of measuring the beam shape and position of the white synchrotron beam. In this paper, measurements are presented that were conducted at ESRF beamline ID6 which uses an in‐vacuum cryogenically cooled permanent‐magnet undulator (CPMU18) and a traditional U32 undulator as its radiation sources, allowing tests to be performed at very high power density levels that were adjusted by changing the gap of the undulators. These measurements show that it is possible to record beam shape and beam position using a simple geometry without having to place any further items in the beam path. With this simple test setup it was possible to record the beam position with a root‐mean‐square noise figure of 150 nm.