Open AccessFull‐field spectroscopic measurement of the X‐ray beam from a multilayer monochromator using a hyperspectral X‐ray camera
Author(s) -
Boone Matthieu N.,
Van Assche Frederic,
Vanheule Sander,
Cipiccia Silvia,
Wang Hongchang,
Vincze Laszlo,
Van Hoorebeke Luc
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519015212
Subject(s) - monochromator , optics , undulator , hyperspectral imaging , synchrotron , spectral power distribution , physics , beam (structure) , synchrotron radiation , harmonics , detector , spectral imaging , materials science , remote sensing , wavelength , quantum mechanics , voltage , geology
Multilayer monochromator devices are commonly used at (imaging) beamlines of synchrotron facilities to shape the X‐ray beam to relatively small bandwidth and high intensity. However, stripe artefacts are often observed and can deteriorate the image quality. Although the intensity distribution of these artefacts has been described in the literature, their spectral distribution is currently unknown. To assess the spatio‐spectral properties of the monochromated X‐ray beam, the direct beam has been measured for the first time using a hyperspectral X‐ray detector. The results show a large number of spectral features with different spatial distributions for a [Ru, B 4 C] strip monochromator, associated primarily with the higher‐order harmonics of the undulator and monochromator. It is found that their relative contributions are sufficiently low to avoid an influence on the imaging data. The [V, B 4 C] strip suppresses these high‐order harmonics even more than the former, yet at the cost of reduced efficiency.