Open AccessA Monte Carlo ray‐tracing simulation of coherent X‐ray diffractive imaging
Author(s) -
Fevola Giovanni,
Bergbäck Knudsen Erik,
Ramos Tiago,
Carbone Dina,
Wenzel Andreasen Jens
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519014425
Subject(s) - ray tracing (physics) , optics , monte carlo method , diffraction , wavefront , coherent diffraction imaging , ptychography , paraxial approximation , wavelet , computer science , physics , fresnel zone , algorithm , fresnel diffraction , phase retrieval , computational physics , beam (structure) , mathematics , fourier transform , statistics , quantum mechanics , artificial intelligence
Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave‐based or hybrid X‐ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating‐like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase‐retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non‐standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large‐parameter space.