Open AccessA von Hamos‐type hard X‐ray spectrometer at the PETRA III beamline P64
Author(s) -
Kalinko Aleksandr,
Caliebe Wolfgang A.,
Schoch Roland,
Bauer Matthias
Publication year - 2020
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519013638
Subject(s) - beamline , spectrometer , optics , spectrum analyzer , physics , resolution (logic) , detector , line (geometry) , synchrotron , beam (structure) , computer science , artificial intelligence , geometry , mathematics
The design and performance of the high‐resolution wavelength‐dispersive multi‐crystal von Hamos‐type spectrometer at PETRA III beamline P64 are described. Extended analyzer crystal collection available at the beamline allows coverage of a broad energy range from 5 keV to 20 keV with an energy resolution of 0.35–1 eV. Particular attention was paid to enabling two‐color measurements by a combination of two types of analyzer crystals and two two‐dimensional detectors. The performance of the spectrometer is demonstrated by elastic‐line and emission‐line measurements on various compounds.