Open AccessThickness of carbon coatings on silicon materials determined by hard X‐ray photoelectron spectroscopy at multiple photon energies
Author(s) -
Isomura Noritake,
Takahashi Naoko,
Kosaka Satoru,
Kawaura Hiroyuki
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519010981
Subject(s) - x ray photoelectron spectroscopy , silicon , carbon fibers , materials science , lithium (medication) , parallelepiped , intensity (physics) , analytical chemistry (journal) , chemistry , optics , composite material , nuclear magnetic resonance , optoelectronics , physics , medicine , geometry , mathematics , chromatography , composite number , endocrinology
Hard X‐ray photoelectron spectroscopy at multiple photon energies is used to investigate the surface structure of carbon coatings on silicon materials destined for use as negative electrodes in lithium‐ion batteries. The photoelectron intensity from the carbon coatings decreases with an increase in the kinetic energy of the photoelectron. By fitting the photoelectron intensity versus energy to numerically derived curves, the thickness and coverage of the carbon coatings can be obtained. The results are in agreement with the values suggested by the cross‐sectional secondary‐electron microscopy images of the carbon coatings, although the thickness should be corrected by accounting for the rectangular parallelepiped structure of the silicon material.