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On the advantages of operation in second‐order diffraction of blazed gratings in soft X‐ray monochromators
Author(s) -
Jark Werner
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519009421
Subject(s) - blazed grating , diffraction , optics , diffraction efficiency , grating , diffraction grating , physics , synchrotron radiation , materials science , optoelectronics
The fact that a diffraction grating can provide twofold‐smaller bandwidth when operated in second‐order diffraction is long known and applied routinely in the laboratory for spectroscopy in the visible and ultraviolet spectral range. A similar routine operation in monochromators for the soft X‐ray range is not reported yet. This study will thus address the feasibility of efficient diffraction of soft X‐rays in the second order at reflection gratings when operated at grazing angles of incidence. The related systematic study could make profitable use of a recently introduced simple analytical equation for the prediction of the diffraction efficiency of blazed gratings with an ideal sawtooth profile. The predictions are then verified by use of rigorous calculations. The principle finding is that, by operation of gratings with lower groove densities, and thus with higher efficiencies, in higher order diffraction, one can extend the tuning in existing instruments with mechanical/optical limitations to larger photon energies. The performance in terms of transmission and spectral resolving power can be very similar to the performance of a grating with a larger groove density, which would otherwise have to be used for accessing the same energy range. This would allow operation of a single highly efficient grating over a larger photon energy interval at a modern synchrotron radiation source, e.g. from 0.3 to 2.2 keV. Without any requirement for a sophisticated grating exchange scheme, a related instrument promises to be sufficiently stable for the needs imposed by the improvements in source point stability at diffraction‐limited storage rings.

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