Open AccessFORTE – a multipurpose high‐vacuum diffractometer for tender X‐ray diffraction and spectroscopy at the SIRIUS beamline of Synchrotron SOLEIL
Author(s) -
Ciatto G.,
Aubert N.,
Lecroard M.,
Engblom C.,
Fontaine P.,
Dubuisson J.-M.,
Abiven Y.-M.,
Janolin P.-E.,
Kiat J.-M.,
Dumont Y.,
Berini B.,
Fouchet A.,
Keller N.
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519003722
Subject(s) - beamline , optics , diffractometer , synchrotron , physics , diffraction , powder diffractometer , materials science , beam (structure) , scanning electron microscope
A new high‐vacuum multipurpose diffractometer (called FORTE from the French acronyms of the project) has recently been installed at the tender/hard X‐ray SIRIUS beamline of Synchrotron SOLEIL, France. The geometry chosen allows one to work either in the classical Eulerian four‐circle geometry for bulk X‐ray diffraction (XRD) or in the z ‐axis geometry for surface XRD. The diffractometer nicely fits the characteristics of the SIRIUS beamline, optimized to work in the 1.1–4.5 keV range, and allows one to perform unprecedented diffraction anomalous fine structure (DAFS) experiments in the tender X‐ray region, also around non‐specular reflections, covering a large reciprocal‐space volume. Installation of an X‐ray fluorescence detector on a dedicated flange allows simultaneous DAFS and X‐ray absorption (XAS) measurements. The access to the tender X‐ray region paves the way to resonant investigations around the L ‐edges of second‐row transition elements which are constituents of functional oxide materials. It also enables access to several edges of interest for semiconductors. Finally, the control architecture based on synchronized Delta Tau units opens up exciting perspectives for improvement of the mechanical sphere of confusion.