Open AccessA high‐throughput energy‐dispersive tender X‐ray spectrometer for shot‐to‐shot sulfur measurements
Author(s) -
Abraham Baxter,
Nowak Stanislaw,
Weninger Clemens,
Armenta Rebecca,
Defever Jim,
Day David,
Carini Gabriella,
Nakahara Kazutaka,
Gallo Alessandro,
Nelson Silke,
Nordlund Dennis,
Kroll Thomas,
Hunter Mark S.,
van Driel Tim,
Zhu Diling,
Weng Tsu-Chien,
Alonso-Mori Roberto,
Sokaras Dimosthenis
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519002431
Subject(s) - spectrometer , optics , spectroscopy , synchrotron , x ray spectroscopy , x ray , synchrotron radiation , laser , sulfur , instrumentation (computer programming) , photon , physics , materials science , computer science , quantum mechanics , metallurgy , operating system
An X‐ray emission spectrometer that can detect the sulfur K α emission lines with large throughput and a high energy resolution is presented. The instrument is based on a large d ‐spacing perfect Bragg analyzer that diffracts the sulfur K α emission at close to backscattering angles. This facilitates the application of efficient concepts routinely employed in hard X‐ray spectrometers towards the tender X‐ray regime. The instrument described in this work is based on an energy‐dispersive von Hamos geometry that is well suited for photon‐in photon‐out spectroscopy at X‐ray free‐electron laser and synchrotron sources. Comparison of its performance with previously used instrumentation is presented through measurements using sulfur‐containing species performed at the LCLS. It is shown that the overall signal intensity is increased by a factor of ∼15. Implementation of this approach in the design of a tender X‐ray spectroscopy endstation for LCLS‐II is also discussed.