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Reaction microscope endstation at FLASH2
Author(s) -
Schmid Georg,
Schnorr Kirsten,
Augustin Sven,
Meister Severin,
Lindenblatt Hannes,
Trost Florian,
Liu Yifan,
Braune Markus,
Treusch Rolf,
Schröter Claus Dieter,
Pfeifer Thomas,
Moshammer Robert
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519002236
Subject(s) - extreme ultraviolet , beamline , optics , microscope , spectroscopy , laser , coincidence , electron microscope , physics , beam (structure) , quantum mechanics , medicine , alternative medicine , pathology
A reaction microscope dedicated to multi‐particle coincidence spectroscopy on gas‐phase samples is installed at beamline FL26 of the free‐electron laser FLASH2 in Hamburg. The main goals of the instrument are to follow the dynamics of atoms, molecules and small clusters on their natural time‐scale and to study non‐linear light–matter interaction with such systems. To this end, the reaction microscope is combined with an in‐line extreme‐ultraviolet (XUV) split‐delay and focusing optics, which allows time‐resolved XUV‐XUV pump–probe spectroscopy to be performed.

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