Open AccessZone plates for angle‐resolved photoelectron spectroscopy providing sub‐micrometre resolution in the extreme ultraviolet regime
Author(s) -
Rösner Benedikt,
Dudin Pavel,
Bosgra Jeroen,
Hoesch Moritz,
David Christian
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577519000869
Subject(s) - extreme ultraviolet , angle resolved photoemission spectroscopy , optics , materials science , x ray photoelectron spectroscopy , resolution (logic) , photoemission spectroscopy , ultraviolet photoelectron spectroscopy , spectroscopy , beamline , heterojunction , zone plate , ultraviolet , diamond , optoelectronics , physics , diffraction , electronic structure , laser , nuclear magnetic resonance , condensed matter physics , beam (structure) , quantum mechanics , artificial intelligence , computer science , composite material
This article reports on the fabrication and testing of dedicated Fresnel zone plates for use at the nano‐ARPES branch of the I05‐ARPES beamline of Diamond Light Source to perform angle‐resolved photoelectron spectroscopy with sub‐micrometre resolution in real space. The aim of the design was to provide high photon flux combined with sub‐micrometre spot sizes. The focusing lenses were tested with respect to efficiency and spatial resolution in the extreme ultraviolet between 50 eV and 90 eV. The experimentally determined diffraction efficiencies of the zone plates are as high as 8.6% at 80 eV, and a real‐space resolution of 0.4 µm was demonstrated. Using the zone‐plate‐based setup, monolayer flakes of the two‐dimensional semiconductor WS 2 were investigated. This work demonstrates that the local electronic structure can be obtained from an area of a few micrometres across a two‐dimensional heterostructure.