
The Nanodiffraction beamline ID01/ESRF: a microscope for imaging strain and structure
Author(s) -
Leake Steven J.,
Chahine Gilbert A.,
Djazouli Hamid,
Zhou Tao,
Richter Carsten,
Hilhorst Jan,
Petit Lucien,
Richard Marie-Ingrid,
Morawe Christian,
Barrett Raymond,
Zhang Lin,
Homs-Regojo Roberto A.,
Favre-Nicolin Vincent,
Boesecke Peter,
Schülli Tobias U.
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057751900078x
Subject(s) - beamline , mosaicity , optics , microscope , coherent diffraction imaging , synchrotron radiation , microscopy , diffraction , tilt (camera) , materials science , synchrotron , advanced photon source , physics , phase retrieval , x ray crystallography , engineering , beam (structure) , fourier transform , mechanical engineering , quantum mechanics
The ID01 beamline has been built to combine Bragg diffraction with imaging techniques to produce a strain and mosaicity microscope for materials in their native or operando state. A scanning probe with nano‐focused beams, objective‐lens‐based full‐field microscopy and coherent diffraction imaging provide a suite of tools which deliver micrometre to few nanometre spatial resolution combined with 10 −5 strain and 10 −3 tilt sensitivity. A detailed description of the beamline from source to sample is provided and serves as a reference for the user community. The anticipated impact of the impending upgrade to the ESRF – Extremely Brilliant Source is also discussed.