Open AccessTowards chemically neutral carbon cleaning processes: plasma cleaning of Ni, Rh and Al reflective optical coatings and thin Al filters for free‐electron lasers and synchrotron beamline applications
Author(s) -
Moreno Fernández Harol,
Zangrando Marco,
Sauthier Guillaume,
Goñi Alejandro R.,
Carlino Vincent,
Pellegrin Eric
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577518014017
Subject(s) - materials science , carbon fibers , x ray photoelectron spectroscopy , inductively coupled plasma , plasma , synchrotron , analytical chemistry (journal) , beamline , optics , chemical engineering , chemistry , composite material , physics , beam (structure) , chromatography , quantum mechanics , composite number , engineering
The choice of a reflective optical coating or filter material has to be adapted to the intended field of application. This is mainly determined by the required photon energy range or by the required reflection angle. Among various materials, nickel and rhodium are common materials used as reflective coatings for (soft) X‐ray mirrors. Similarly, aluminium is one of the most commonly used materials for extreme ultraviolet and soft X‐ray transmission filters. However, both of these types of optics are subject to carbon contamination, which can be increasingly problematic for the operation of the high‐performance free‐electron laser and synchrotron beamlines. As an attempt to remove this type of contamination, an inductively coupled plasma source has been used in conjunction with N 2 /O 2 /H 2 and N 2 /H 2 feedstock gas plasmas. Results from the chemical surface analysis of the above materials before and after plasma treatment using X‐ray photoelectron spectroscopy are reported. It is concluded that a favorable combination of an N 2 /H 2 plasma feedstock gas mixture leads to the best chemical surface preservation of Ni, Rh and Al while removing the carbon contamination. However, this feedstock gas mixture does not remove C contamination as rapidly as, for example, an N 2 /O 2 /H 2 plasma which induces the surface formation of NiO and NiOOH in Ni and RhOOH in Rh foils. As an applied case, the successful carbon removal from ultrathin Al filters previously used at the FERMI FEL1 using an N 2 /H 2 plasma is demonstrated.