Open AccessOne‐dimensional parallax‐free position‐sensitive detector for diffraction measurements based on a home‐made thin THGEM
Author(s) -
Chen Shi,
Liu Hongbang,
Liu Qian,
Zheng Yangheng,
Wang Binglong,
Huang Wenqian,
Dong Yang,
Rong Yu,
Jiao Xinda,
Guan Yu,
Wang Jing,
Li Min,
Liu Jizhou,
Zhang Mengmeng
Publication year - 2019
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s160057751801086x
Subject(s) - gas electron multiplier , optics , diffraction , synchrotron radiation , materials science , powder diffraction , detector , beamline , parallax , physics , optoelectronics , nuclear magnetic resonance , beam (structure) , astronomy
A large parallax‐free gas diffraction meter based on a thinner‐THGEM (thick gaseous electron multiplier) has been developed at the Beijing Synchrotron Radiation Facility (BSRF). A thinner‐THGEM of thickness 200 µm is adopted, which can be shaped into a curve to eliminate parallax‐error effects. The detector is designed to have a 48° open angle positioned 20 cm from the powder samples. A front‐end electronics board with 128 channels direct‐current mode was adapted for the 8 keV BSRF beamline with 0.2 ns/100 ns stable duty cycle. Two powder samples, TiO 2 and SnO 2 , were tested separately. The measured spectra with an angular resolution of 0.148 ± 0.081° are consistent with the data from the powder diffraction file. Combining the gas gain of the thinner‐THGEM with the electronic circuit dynamic range, a very broad dynamic range of about 10 7 could be obtained.