Open AccessRealization of a scanning soft X‐ray microscope for magnetic imaging under high magnetic fields
Author(s) -
Kotani Yoshinori,
Senba Yasunori,
Toyoki Kentaro,
Billington David,
Okazaki Hiroyuki,
Yasui Akira,
Ueno Wakana,
Ohashi Haruhiko,
Hirosawa Satoshi,
Shiratsuchi Yu,
Nakamura Tetsuya
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577518009177
Subject(s) - magnetic circular dichroism , x ray magnetic circular dichroism , scanning electron microscope , magnet , microscope , magnetic force microscope , materials science , optics , beamline , magnetic field , magnetic domain , physics , magnetization , spectral line , beam (structure) , quantum mechanics , astronomy
For the purpose of imaging element‐ and shell‐specific magnetic distributions under high magnetic fields, a scanning soft X‐ray microscope has been developed at beamline BL25SU, SPring‐8, Japan. The scanning X‐ray microscope utilizes total electron yield detection of absorbed circularly polarized soft X‐rays in order to observe magnetic domains through the X‐ray magnetic circular dichroism effect. Crucially, this system is equipped with an 8 T superconducting magnet. The performance and features of the present system are demonstrated by magnetic domain observations of the fractured surface of a Nd 14.0 Fe 79.7 Cu 0.1 B 6.2 sintered magnet.