Open AccessMore are better, but the details matter: combinations of multiple Fresnel zone plates for improved resolution and efficiency in X‐ray microscopy
Author(s) -
Li Kenan,
Jacobsen Chris
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577518007208
Subject(s) - fresnel zone , zone plate , optics , materials science , stacking , diffraction , x ray optics , synchrotron , focus (optics) , fresnel zone antenna , beam (structure) , fresnel diffraction , image resolution , transverse plane , depth of focus (tectonics) , resolution (logic) , fresnel number , x ray , physics , computer science , geology , telecommunications , paleontology , smart antenna , subduction , structural engineering , nuclear magnetic resonance , artificial intelligence , dipole antenna , antenna (radio) , tectonics , engineering
Fresnel zone plates used for X‐ray nanofocusing face high‐aspect‐ratio nanofabrication challenges in combining narrow transverse features (for high spatial resolution) along with extended optical modulation along the X‐ray beam direction (to improve efficiency). The stacking of multiple Fresnel zone plates along the beam direction has already been shown to offer improved characteristics of resolution and efficiency when compared with thin single zone plates. Using multislice wave propagation simulation methods, here a number of new schemes for the stacking of multiple Fresnel zone plates are considered. These include consideration of optimal thickness and spacing in the axial direction, and methods to capture a fraction of the light otherwise diffracted into unwanted orders, and instead bring it into the desired first‐order focus. The alignment tolerances for stacking multiple Fresnel zone plates are also considered.