Open AccessAn all‐diamond X‐ray position and flux monitor using nitrogen‐incorporated ultra‐nanocrystalline diamond contacts
Author(s) -
Zou Mengnan,
Gaowei Mengjia,
Zhou Tianyi,
Sumant Anirudha V.,
Jaye Cherno,
Fisher Daniel A.,
Bohon Jen,
Smedley John,
Muller Erik M.
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577518006318
Subject(s) - diamond , materials science , fabrication , silicon , substrate (aquarium) , optoelectronics , nanocrystalline material , electrode , nanotechnology , synthetic diamond , optics , composite material , chemistry , physics , medicine , oceanography , alternative medicine , pathology , geology
Diamond X‐ray detectors with conducting nitrogen‐incorporated ultra‐nanocrystalline diamond (N‐UNCD) films as electrodes were fabricated to measure X‐ray beam flux and position. Structural characterization and functionality tests were performed for these devices. The N‐UNCD films grown on unseeded diamond substrates were compared with N‐UNCD films grown on a seeded silicon substrate. The feasibility of the N‐UNCD films acting as electrodes for X‐ray detectors was confirmed by the stable performance in a monochromatic X‐ray beam. The fabrication process is able to change the surface status which may influence the signal uniformity under low bias, but this effect can be neglected under full collection bias.