Open AccessA high‐energy‐resolution resonant inelastic X‐ray scattering spectrometer at ID20 of the European Synchrotron Radiation Facility
Author(s) -
Moretti Sala M.,
Martel K.,
Henriquet C.,
Al Zein A.,
Simonelli L.,
Sahle Ch. J.,
Gonzalez H.,
Lagier M.-C.,
Ponchut C.,
Huotari S.,
Verbeni R.,
Krisch M.,
Monaco G.
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577518001200
Subject(s) - resonant inelastic x ray scattering , spectrometer , synchrotron radiation , beamline , scattering , inelastic scattering , synchrotron , spectroscopy , x ray spectroscopy , atomic physics , resolution (logic) , optics , materials science , physics , x ray raman scattering , beam (structure) , quantum mechanics , artificial intelligence , computer science
An end‐station for resonant inelastic X‐ray scattering and (resonant) X‐ray emission spectroscopy at beamline ID20 of ESRF – The European Synchrotron is presented. The spectrometer hosts five crystal analysers in Rowland geometry for large solid angle collection and is mounted on a rotatable arm for scattering in both the horizontal and vertical planes. The spectrometer is optimized for high‐energy‐resolution applications, including partial fluorescence yield or high‐energy‐resolution fluorescence detected X‐ray absorption spectroscopy and the study of elementary electronic excitations in solids. In addition, it can be used for non‐resonant inelastic X‐ray scattering measurements of valence electron excitations.