Open AccessAn IAEA multi‐technique X‐ray spectrometry endstation at Elettra Sincrotrone Trieste: benchmarking results and interdisciplinary applications
Author(s) -
Karydas Andreas Germanos,
Czyzycki Mateusz,
Leani Juan José,
Migliori Alessandro,
Osan Janos,
Bogovac Mladen,
Wrobel Pawel,
Vakula Nikita,
Padilla-Alvarez Roman,
Menk Ralf Hendrik,
Gol Maryam Ghahremani,
Antonelli Matias,
Tiwari Manoj K,
Caliri Claudia,
Vogel-Mikuš Katarina,
Darby Iain,
Kaiser Ralf Bernd
Publication year - 2018
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577517016332
Subject(s) - beamline , synchrotron radiation , synchrotron , physics , x ray , storage ring , optics , beam (structure)
The International Atomic Energy Agency (IAEA) jointly with the Elettra Sincrotrone Trieste (EST) operates a multipurpose X‐ray spectrometry endstation at the X‐ray Fluorescence beamline (10.1L). The facility has been available to external users since the beginning of 2015 through the peer‐review process of EST. Using this collaboration framework, the IAEA supports and promotes synchrotron‐radiation‐based research and training activities for various research groups from the IAEA Member States, especially those who have limited previous experience and resources to access a synchrotron radiation facility. This paper aims to provide a broad overview about various analytical capabilities, intrinsic features and performance figures of the IAEA X‐ray spectrometry endstation through the measured results. The IAEA–EST endstation works with monochromatic X‐rays in the energy range 3.7–14 keV for the Elettra storage ring operating at 2.0 or 2.4 GeV electron energy. It offers a combination of different advanced analytical probes, e.g. X‐ray reflectivity, X‐ray absorption fine‐structure measurements, grazing‐incidence X‐ray fluorescence measurements, using different excitation and detection geometries, and thereby supports a comprehensive characterization for different kinds of nanostructured and bulk materials.