Open AccessPost‐sample aperture for low background diffraction experiments at X‐ray free‐electron lasers
Author(s) -
Wiedorn Max O.,
Awel Salah,
Morgan Andrew J.,
Barthelmess Miriam,
Bean Richard,
Beyerlein Kenneth R.,
Chavas Leonard M. G.,
Eckerskorn Niko,
Fleckenstein Holger,
Heymann Michael,
Horke Daniel A.,
Knoška Juraj,
Mariani Valerio,
Oberthür Dominik,
Roth Nils,
Yefanov Oleksandr,
Barty Anton,
Bajt Saša,
Küpper Jochen,
Rode Andrei V.,
Kirian Richard A.,
Chapman Henry N.
Publication year - 2017
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577517011961
Subject(s) - scattering , diffraction , optics , aperture (computer memory) , physics , sample (material) , flash (photography) , materials science , acoustics , thermodynamics
The success of diffraction experiments from weakly scattering samples strongly depends on achieving an optimal signal‐to‐noise ratio. This is particularly important in single‐particle imaging experiments where diffraction signals are typically very weak and the experiments are often accompanied by significant background scattering. A simple way to tremendously reduce background scattering by placing an aperture downstream of the sample has been developed and its application in a single‐particle X‐ray imaging experiment at FLASH is demonstrated. Using the concept of a post‐sample aperture it was possible to reduce the background scattering levels by two orders of magnitude.