Open AccessA novel method for resonant inelastic soft X‐ray scattering via photoelectron spectroscopy detection
Author(s) -
Dakovski Georgi L.,
Lin Ming-Fu,
Damiani Daniel S.,
Schlotter William F.,
Turner Joshua J.,
Nordlund Dennis,
Ogasawara Hirohito
Publication year - 2017
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577517011869
Subject(s) - resonant inelastic x ray scattering , spectrometer , physics , inelastic scattering , optics , photoelectric effect , photon , spectroscopy , detector , scattering , grating , x ray raman scattering , quantum mechanics
A method for measuring resonant inelastic X‐ray scattering based on the conversion of X‐ray photons into photoelectrons is presented. The setup is compact, relies on commercially available detectors, and offers significant flexibility. This method is demonstrated at the Linac Coherent Light Source with ∼0.5 eV resolution at the cobalt L 3 ‐edge, with signal rates comparable with traditional grating spectrometers.