Open AccessDesign and performance of an X‐ray scanning microscope at the Hard X‐ray Nanoprobe beamline of NSLS‐II
Author(s) -
Nazaretski E.,
Yan H.,
Lauer K.,
Bouet N.,
Huang X.,
Xu W.,
Zhou J.,
Shu D.,
Hwu Y,
Chu Y. S.
Publication year - 2017
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577517011183
Subject(s) - beamline , microscope , optics , synchrotron , materials science , nanoprobe , resolution (logic) , synchrotron radiation , x ray , microscopy , diffraction , physics , fluorescence , computer science , beam (structure) , artificial intelligence
A hard X‐ray scanning microscope installed at the Hard X‐ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.