Open AccessTemperature‐dependent thermal properties of Ru/C multilayers
Author(s) -
Yan Shuai,
Jiang Hui,
Wang Hua,
He Yan,
Li Aiguo,
Zheng Yi,
Dong Zhaohui,
Tian Naxi
Publication year - 2017
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s1600577517008542
Subject(s) - materials science , monochromator , thermal conduction , thermal stability , thermal conductivity , reflectometry , thermal , thermal expansion , annealing (glass) , scattering , negative thermal expansion , condensed matter physics , optics , analytical chemistry (journal) , thermodynamics , composite material , optoelectronics , chemistry , physics , wavelength , time domain , organic chemistry , computer science , computer vision , chromatography
Multilayers made of Ru/C are the most promising candidates when working in the energy region 8–20 keV. The stability of its thermal properties, including thermal expansion and thermal conduction, needs to be considered for monochromator or focusing components. Ru/C multilayers with periodic thicknesses of 3, 4 and 5 nm were investigated in situ by grazing‐incidence X‐ray reflectometry and diffuse scattering in order to study their thermal expansion characteristics as a function of annealing temperature up to 400°C. The thermal conductivity of multilayers with the same structure was also measured by the transient hot‐wire method and compared with bulk values.